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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">sudexpert</journal-id><journal-title-group><journal-title xml:lang="ru">Теория и практика судебной экспертизы</journal-title><trans-title-group xml:lang="en"><trans-title>Theory and Practice of Forensic Science</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">1819-2785</issn><issn pub-type="epub">2587-7275</issn><publisher><publisher-name>The Russian Federal Centre of Forensic Science</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.30764/1819-2785-2018-13-3-109-115</article-id><article-id custom-type="elpub" pub-id-type="custom">sudexpert-454</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ЭКСПЕРТНАЯ ПРАКТИКА</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>FORENSIC CASEWORK</subject></subj-group></article-categories><title-group><article-title>Применение технологий JTAG и Chip-Off в исследовании мобильных устройств</article-title><trans-title-group xml:lang="en"><trans-title>JTAG and Chip-Off Technologies in Computer Forensics</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Яковлев</surname><given-names>А. Н.</given-names></name><name name-style="western" xml:lang="en"><surname>Yakovlev</surname><given-names>A. N.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Яковлев Алексей Николаевич – к. ю. н., доцент, заместитель руководителя отдела компьютерно-технических и инженерно-технических исследований; доцент кафедры юриспруденции, интеллектуальной собственности и судебной экспертизы..</p><p>Москва.</p></bio><bio xml:lang="en"><p> Aleksei N. Yakovlev – Candidate of Law, Associate Professor, Deputy Head of the Digital Forensics Division; Associate Professor of the Law, Intellectual Property and Forensics Department.</p><p>Moscow.</p></bio><email xlink:type="simple">all-eks@mail.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Данилова</surname><given-names>А. С.</given-names></name><name name-style="western" xml:lang="en"><surname>Danilova</surname><given-names>A. S.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Данилова Анна Сергеевна – студент кафедры юриспруденции, интеллектуальной собственности и судебной экспертизы.</p><p>Москва.</p></bio><bio xml:lang="en"><p>Anna S. Danilova – Student of the Law, Intellectual Property and Forensics Department.</p><p>Moscow.</p></bio><email xlink:type="simple">bmstu@mail.ru</email><xref ref-type="aff" rid="aff-2"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Управление организации экспертно-криминалистической деятельности Главного управления криминалистики Следственного комитета Российской Федерации; ФГБОУ ВО «Московский государственный технический университет имени Н.Э. Баумана (национальный исследовательский университет)».</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Department of Organization of Expert Activities of the General Directorate of Criminalistics (Criminalistics&#13;
Center) of the Investigative Committee of the Russian Federation; Bauman Moscow State Technical University (National Research University of Technology).</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru"><institution>ФГБОУ ВО «Московский государственный технический университет имени Н.Э. Баумана (национальный исследовательский университет)».</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Bauman Moscow State Technical University (National Research University of Technology).</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2018</year></pub-date><pub-date pub-type="epub"><day>30</day><month>09</month><year>2018</year></pub-date><volume>13</volume><issue>3</issue><fpage>109</fpage><lpage>115</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Яковлев А.Н., Данилова А.С., 2018</copyright-statement><copyright-year>2018</copyright-year><copyright-holder xml:lang="ru">Яковлев А.Н., Данилова А.С.</copyright-holder><copyright-holder xml:lang="en">Yakovlev A.N., Danilova A.S.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://www.tipse.ru/jour/article/view/454">https://www.tipse.ru/jour/article/view/454</self-uri><abstract><p>Статья посвящена вопросу извлечения данных с поврежденных мобильных устройств с помощью технологий JTAG и Chip-Off. Описаны практические эксперименты по извлечению данных с помощью интерфейса JTAG из телефона HTC модели Wildfire S и методом Chip-Off из телефона BQ модели S-4525 Vienna. Выявлены знания и навыки, необходимые эксперту в работе при использовании этих технологий.</p></abstract><trans-abstract xml:lang="en"><p>The article focuses on the issue of damaged handheld device data extraction with the help of JTAG and Chip-Off technologies. Practical experiments were conducted to extract data from an HTC Wildfire S phone using the JTAG interface and from a BQ S-4525 Vienna phone using the Chip-Off technology. Also discussed are the knowledge and skills required for successful application of these methods by practitioners.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>JTAG</kwd><kwd>Chip-Off</kwd><kwd>судебная компьютерно-техническая экспертиза</kwd><kwd>извлечение данных</kwd><kwd>восстановление данных</kwd></kwd-group><kwd-group xml:lang="en"><kwd>JTAG</kwd><kwd>Chip-Off</kwd><kwd>computer forensics</kwd><kwd>extraction of data</kwd><kwd>data recovery</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Угрюмов Е.П. Цифровая схемотехника: учеб. пособие для вузов. 3-е изд., перераб. и доп. СПб.: БХВ-Петербург, 2010. 816 с.</mixed-citation><mixed-citation xml:lang="en">Ugryumov E.P. Digital circuitry: a textbook for universities. 3rd ed. Saint Petersburg: BHV-Petersburg, 2010. 816 p. (In Russ.)</mixed-citation></citation-alternatives></ref><ref id="cit2"><label>2</label><citation-alternatives><mixed-citation xml:lang="ru">Elder B. Chip-Off and JTAG Analysis. URL: http://www.evidencemagazine.com/index. php?option=com_content&amp;task=view&amp;id=922.</mixed-citation><mixed-citation xml:lang="en">Elder B. Chip-Off and JTAG Analysis. URL: http://www.evidencemagazine.com/index. php?option=com_content&amp;task=view&amp;id=922</mixed-citation></citation-alternatives></ref><ref id="cit3"><label>3</label><citation-alternatives><mixed-citation xml:lang="ru">Воройский Ф.С. Информатика. Энциклопедический словарь-справочник: Введение в современные информационные и телекоммуникационные технологии в терминах и фактах. М.: Физматлит, 2006. 768 с.</mixed-citation><mixed-citation xml:lang="en">Voroiskii F.S. Computer science. Encyclopedic reference dictionary: introduction to modern information and telecommunications technologies in terms and facts. Moscow: Fizmatlit, 2006. 768 p. (In Russ.)</mixed-citation></citation-alternatives></ref></ref-list><fn-group><fn fn-type="conflict"><p>The authors declare that there are no conflicts of interest present.</p></fn></fn-group></back></article>
